- Startpagina tijdschrift
- volume 14 (2011)
- number 1-2
- Short note: Synthetic ilmenite as a blank to XRF trace element determination
sinds 05 februari 2011 :
Weergave(s): 697 (13 ULiège)
Download(s): 397 (11 ULiège)
Weergave(s): 697 (13 ULiège)
Download(s): 397 (11 ULiège)
Jean Clair DUCHESNE & Guy BOLOGNE
Short note: Synthetic ilmenite as a blank to XRF trace element determination
(volume 14 (2011) — number 1-2)
Article
Mots-clés : ilmenite, XRF trace element analysis, Vanadium, Chromium, evacuated silica-glass tube
Abstract
This note describes a convenient method to synthesize a blank ilmenite through the evacuated silica-glass tube technique. The lower limit of detection of the V and Cr determinations are 21 ppm and 9 ppm, respectively.
Om dit artikel te citeren:
Jean Clair DUCHESNE & Guy BOLOGNE, «Short note: Synthetic ilmenite as a blank to XRF trace element determination», Geologica Belgica [En ligne], volume 14 (2011), number 1-2, 103-106 URL : http://popups.ulg.be/1374-8505/index.php?id=3230.
Over : Jean Clair DUCHESNE
Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium
Over : Guy BOLOGNE
Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium