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Jean Clair DUCHESNE & Guy BOLOGNE

Short note: Synthetic ilmenite as a blank to XRF trace element determination

(volume 14 (2011) — number 1-2)
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Mots-clés : ilmenite, XRF trace element analysis, Vanadium, Chromium, evacuated silica-glass tube

Abstract

This note describes a convenient method to synthesize a blank ilmenite through the evacuated silica-glass tube technique. The lower limit of detection of the V and Cr determinations are 21 ppm and 9 ppm, respectively.

Pour citer cet article

Jean Clair DUCHESNE & Guy BOLOGNE, «Short note: Synthetic ilmenite as a blank to XRF trace element determination», Geologica Belgica [En ligne], volume 14 (2011), number 1-2, 103-106 URL : http://popups.ulg.be/1374-8505/index.php?id=3230.

A propos de : Jean Clair DUCHESNE

Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium

A propos de : Guy BOLOGNE

Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium